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Auger Electron Spectroscopy Practical Application To Materials Analysis And Characterization Of Surfaces Interfaces And Thin Films Wolstenholme

  • SKU: BELL-5275522
Auger Electron Spectroscopy Practical Application To Materials Analysis And Characterization Of Surfaces Interfaces And Thin Films Wolstenholme
$ 31.00 $ 45.00 (-31%)

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Auger Electron Spectroscopy Practical Application To Materials Analysis And Characterization Of Surfaces Interfaces And Thin Films Wolstenholme instant download after payment.

Publisher: Momentum Press
File Extension: PDF
File size: 18.32 MB
Pages: 256
Author: Wolstenholme, John
ISBN: 9781606506813, 9781606506820, 1606506811, 160650682X
Language: English
Year: 2015

Product desciption

Auger Electron Spectroscopy Practical Application To Materials Analysis And Characterization Of Surfaces Interfaces And Thin Films Wolstenholme by Wolstenholme, John 9781606506813, 9781606506820, 1606506811, 160650682X instant download after payment.

This book discusses the use of Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a wide range of technological materials, including, metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated and the application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative terms. Major components of typical Auger spectrometers are also described. The book discusses other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy, as well as the relationship between AES and other analysis techniques

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