Roadmap of Scanning Probe Microscopy NanoScience and Technology 2007th Edition by Seizo Morita ISBN 3642070698 978-3642070693 by Morita S. (ed.) 9783540343141, 3540343148 instant download after payment.

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Product details: 

ISBN 10: 3642070698 

ISBN 13: 978-3642070693

Author: Seizo Morita

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

Table of contents: 

• AFM measurement in liquid / Hirofumi Yamada

• Atomic force microscopy / Yasuhiro Sugawara

• Chemical discrimination of atoms and molecules / Komeda Tadahiro, Seizo Morita, Yasuhiro Sugawara

• Characterization of semiconducting materials / Shuji Hasegawa, Masahiko Tomitori

• Electrostatic force microscopy / Masakazu Nakamura and Hirofumi Yamada

• Evaluation of SPM for LSI devices / Koji Usuda, Takashi Furukawa, Yasushi Kadota

• High speed SPM / Toshio Ando

• Magnetic force microscope / Sumio Hosaka

• Manipulation of atoms and molecules / Tadahiro Komeda et al

• Multiprobe SPM / Shuji Hasegawa

• Near-field scanning optical microscope / Toshiharu Saiki

• Probe technology / Masamichi Yoshimura

• Scanning atom probe / Osamu Nishikawa

• Scanning capacitance microscopy / Yoshitsugu Nakagawa

• Scanning nonlinear dielectric microscope / Yasuo Cho

• Scanning tunneling microscopy / Masahiko Tomitori

• Science and technology in the twenty-first century / Seizo Morita

• SPM characterization of biomaterials / Atsushi Ikai, Rehana Afrin

• SPM characterization of catalysts / Hiroshi Onishi

• SPM characterization of organic and polymeric materials / Shukichi Tanaka, Ken Nakajima

• SPM coupled with external fields / Ken Nakajima, Tadahiro Komeda

• STM-induced photon emission spectroscopy / Tooru Murashita

• Theories of SPM / Masaru Tsukada, Shin-ya Hasegawa

• When will SPM realize our dreams? / Osamu Kubo

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Tags: Seizo Morita, Roadmap of Scanning, Probe Microscopy