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Uniting Electron Crystallography And Powder Diffraction 1st Edition William I F David Auth

  • SKU: BELL-4205746
Uniting Electron Crystallography And Powder Diffraction 1st Edition William I F David Auth
$ 31.00 $ 45.00 (-31%)

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Uniting Electron Crystallography And Powder Diffraction 1st Edition William I F David Auth instant download after payment.

Publisher: Springer Netherlands
File Extension: PDF
File size: 12.82 MB
Pages: 434
Author: William I. F. David (auth.), Ute Kolb, Kenneth Shankland, Louisa Meshi, Anatoly Avilov, William I.F David (eds.)
ISBN: 9789400755796, 9789400755802, 9400755791, 9400755805
Language: English
Year: 2012
Edition: 1

Product desciption

Uniting Electron Crystallography And Powder Diffraction 1st Edition William I F David Auth by William I. F. David (auth.), Ute Kolb, Kenneth Shankland, Louisa Meshi, Anatoly Avilov, William I.f David (eds.) 9789400755796, 9789400755802, 9400755791, 9400755805 instant download after payment.

The polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination.

This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of disciplines and materials stretching from archeometry to zeolites. As such, it is a comprehensive and valuable resource for those wishing to gain an understanding of the broad applicability of these two rapidly developing fields.

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