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Advanced Experimental Methods For Noise Research In Nanoscale Electronic Devices 1st Edition Fn Hooge Auth

  • SKU: BELL-2225104
Advanced Experimental Methods For Noise Research In Nanoscale Electronic Devices 1st Edition Fn Hooge Auth
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Advanced Experimental Methods For Noise Research In Nanoscale Electronic Devices 1st Edition Fn Hooge Auth instant download after payment.

Publisher: Springer Netherlands
File Extension: PDF
File size: 3.84 MB
Pages: 368
Author: F.N. Hooge (auth.), Josef Sikula, Michael Levinshtein (eds.)
ISBN: 1402021690, 9781402021695
Language: English
Year: 2005
Edition: 1

Product desciption

Advanced Experimental Methods For Noise Research In Nanoscale Electronic Devices 1st Edition Fn Hooge Auth by F.n. Hooge (auth.), Josef Sikula, Michael Levinshtein (eds.) 1402021690, 9781402021695 instant download after payment.

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

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