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Advanced Scanning Microscopy For Nanotechnology Techniques And Applications Weilie Zhou

  • SKU: BELL-4096638
Advanced Scanning Microscopy For Nanotechnology Techniques And Applications Weilie Zhou
$ 31.00 $ 45.00 (-31%)

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Advanced Scanning Microscopy For Nanotechnology Techniques And Applications Weilie Zhou instant download after payment.

Publisher: New York, NY Springer
File Extension: PDF
File size: 111.73 MB
Pages: 535
Author: Weilie Zhou
ISBN: 9780387333250, 0387333258
Language: English
Year: 2007

Product desciption

Advanced Scanning Microscopy For Nanotechnology Techniques And Applications Weilie Zhou by Weilie Zhou 9780387333250, 0387333258 instant download after payment.

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

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