Circadian Rhythms For Future Resilient Electronic Systems Accelerated Active Selfhealing For Integrated Circuits 1st Ed Xinfei Guo by Xinfei Guo, Mircea R. Stan 9783030200503, 9783030200510, 3030200507, 3030200515 instant download after payment.

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models.

• Presents novel techniques, tested with experiments on real hardware;
• Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;
• Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;
• Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;
• Includes coverage of resilient aspects of emerging applications such as IoT.