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Cmos Sram Circuit Design And Parametric Test In Nanoscaled Technologies Processaware Sram Design And Test Andrei Pavlov

  • SKU: BELL-2567808
Cmos Sram Circuit Design And Parametric Test In Nanoscaled Technologies Processaware Sram Design And Test Andrei Pavlov
$ 31.00 $ 45.00 (-31%)

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Cmos Sram Circuit Design And Parametric Test In Nanoscaled Technologies Processaware Sram Design And Test Andrei Pavlov instant download after payment.

Publisher: Springer
File Extension: PDF
File size: 10.62 MB
Pages: 202
Author: Andrei Pavlov
ISBN: 1402083629
Language: English
Year: 2008

Product desciption

Cmos Sram Circuit Design And Parametric Test In Nanoscaled Technologies Processaware Sram Design And Test Andrei Pavlov by Andrei Pavlov 1402083629 instant download after payment.

As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM cells with parametric sensitivity. Growing sizes of SRAM arrays increase the likelihood of cells with marginal stability and pose strict constraints on transistor parameters distributions.

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