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Defectoriented Testing For Nanometric Cmos Vlsi Circuits 2nd Edition Manoj Sachdev

  • SKU: BELL-977388
Defectoriented Testing For Nanometric Cmos Vlsi Circuits 2nd Edition Manoj Sachdev
$ 31.00 $ 45.00 (-31%)

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Defectoriented Testing For Nanometric Cmos Vlsi Circuits 2nd Edition Manoj Sachdev instant download after payment.

Publisher: Springer
File Extension: PDF
File size: 5.84 MB
Pages: 342
Author: Manoj Sachdev, José Pineda de Gyvez
ISBN: 9780387249933, 0387249931
Language: English
Year: 2007
Edition: 2

Product desciption

Defectoriented Testing For Nanometric Cmos Vlsi Circuits 2nd Edition Manoj Sachdev by Manoj Sachdev, José Pineda De Gyvez 9780387249933, 0387249931 instant download after payment.

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

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