Design Of Highperformance Microprocessor Circuits Anantha P Chandrakasan William J Bowhill Frank Fox by Anantha P Chandrakasan; William J Bowhill; Frank Fox 9780780360013, 078036001X instant download after payment.

Chapter 1 Impact of Physical Technology on Architecture / John H. Edmondson 3 -- Part II Technology Issues 25 -- Chapter 2 CMOS Scaling and Issues in Sub-0.25 [mu]m Systems / Yuan Taur 27 -- Chapter 3 Techniques for Leakage Power Reduction / Vivek De, Yibin Ye, Ali Keshavarzi, Siva Narendra, James Kao, Dinesh Somasekhar, Raj Nair, Shekhar Borkar 46 -- Chapter 4 Low-Voltage Technologies / Tadahiro Kuroda, Takayasu Sakurai 63 -- Chapter 5 Soi Technology and Circuits / Ghavam G. Shahidi, Fari Assaderaghi, Dimitri Antoniadis 80 -- Chapter 6 Models of Process Variations in Device and Interconnect / Duane Boning, Sani Nassif 98 -- Part III Circuit Styles for Logic 117 -- Chapter 7 Basic Logic Families / Kerry Bernstein 119 -- Chapter 8 Issues in Dynamic Logic Design / Paul Gronowski 140 -- Chapter 9 Self-Timed Pipelines / Ted Williams 158 -- Chapter 10 High-Speed VLSI Airthmetic Units: Adders and Multipliers / Vojin G. Oklobdzija 181 -- Part IV Clocking 205 -- Chapter 11 Clocked Storage Elements / Hamid Partovi 207 -- Chapter 12 Design of High-Speed CMOS PLLs and DLLs / John George Maneatis 235 -- Chapter 13 Clock Distribution / Daniel W. Bailey 261 -- Part V Memory System Design 283 -- Chapter 14 Register Files and Chahes / Ronald Preston 285 -- Chapter 15 Embedded Dram / Tadaaki Yamauchi, Michihiro Yamada 309 -- Part VI Interconnect and I/O 329 -- Chapter 16 Analyzing on-Chip Interconnect Effects / Noel Menezes, Lawrence Pileggi 331 -- Chapter 17 Techniques for Driving Interconnect / Shannon V. Morton 352 -- Chapter 18 I/O and ESD Circuit Design / Stephen C. Thierauf, Warren R. Anderson 377 -- Chapter 19 High-Speed Electrical Signaling / Stefanos Sidiropoulos, Chih-Kong Ken Yang, Mark Horowitz 397 -- Part VII Reliability 427 -- Chapter 20 Electromigration Reliability / J. Joseph Clement 429 -- Chapter 21 Hot Carrier Reliability / Kaizad Mistry 449 -- Part VIII Cad Tools and Test 467 -- Chapter 22 Overview of Computer-Aided Design Tools / Yao-Tsung Yen 469 -- Chapter 23 Timing Verification / Victor Peng 480 -- Chapter 24 Design and Analysis of Power Distribution Networks / David Blaauw, Rajendran Panda, Rajat Chaudhry 499 -- Chapter 25 Testing of High-Performance Processors / Dilip K. Bhavsar 523