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Emerging Nanotechnologies Test Defect Tolerance And Reliability 1st Edition T Hogg

  • SKU: BELL-4193102
Emerging Nanotechnologies Test Defect Tolerance And Reliability 1st Edition T Hogg
$ 31.00 $ 45.00 (-31%)

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Emerging Nanotechnologies Test Defect Tolerance And Reliability 1st Edition T Hogg instant download after payment.

Publisher: Springer US
File Extension: PDF
File size: 9.48 MB
Pages: 408
Author: T. Hogg, G. Snider (auth.), Mohammad Tehranipoor (eds.)
ISBN: 9780387747460, 9780387747477, 038774746X, 0387747478
Language: English
Year: 2008
Edition: 1

Product desciption

Emerging Nanotechnologies Test Defect Tolerance And Reliability 1st Edition T Hogg by T. Hogg, G. Snider (auth.), Mohammad Tehranipoor (eds.) 9780387747460, 9780387747477, 038774746X, 0387747478 instant download after payment.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

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