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Fullfield Measurements And Identification In Solid Mechanics Michelgrediac

  • SKU: BELL-4304714
Fullfield Measurements And Identification In Solid Mechanics Michelgrediac
$ 31.00 $ 45.00 (-31%)

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Fullfield Measurements And Identification In Solid Mechanics Michelgrediac instant download after payment.

Publisher: Wiley-ISTE
File Extension: PDF
File size: 13.74 MB
Pages: 485
Author: michel-grediac
ISBN: 9781118578469, 9781848212947, 1118578465, 1848212941
Language: English
Year: 2012

Product desciption

Fullfield Measurements And Identification In Solid Mechanics Michelgrediac by Michel-grediac 9781118578469, 9781848212947, 1118578465, 1848212941 instant download after payment.

This timely book presents cutting-edge developments by experts in the field on the rapidly developing and scientifically challenging area of full-field measurement techniques used in solid mechanics – including photoelasticity, grid methods, deflectometry, holography, speckle interferometry and digital image correlation. The evaluation of strains and the use of the measurements in subsequent parameter identification techniques to determine material properties are also presented.
Since parametric identification techniques require a close coupling of theoretical models and experimental measurements, the book focuses on specific modeling approaches that include finite element model updating, the equilibrium gap method, constitutive equation gap method, virtual field method and reciprocity gap method. In the latter part of the book, the authors discuss two particular applications of selected methods that are of special interest to many investigators: the analysis of localized phenomenon and connections between microstructure and constitutive laws. The final chapter highlights infrared measurements and their use in the mechanics of materials.
Written and edited by knowledgeable scientists, experts in their fields, this book will be a valuable resource for all students, faculties and scientists seeking to expand their understanding of an important, growing research area

Content:
Chapter 1 Basics of Metrology and Introduction to Techniques (pages 1–30): Andre Chrysochoos and Yves Surrel
Chapter 2 Photoelasticity (pages 31–60): Fabrice Bremand and Jean?Christophe Dupre
Chapter 3 Grid Method, Moire and Deflectometry (pages 61–92): Jerome Molimard and Yves Surrel
Chapter 4 Digital Holography Methods (pages 93–124): Pascal Picart and Paul Smigielski
Chapter 5 Elementary Speckle Interferometry (pages 125–156): Pierre Jacquot, Pierre Slangen and Dan Borza
Chapter 6 Digital Image Correlation (pages 157–190): Michel Bornert, Francois Hild, Jean?Jose Orteu and Stephane Roux
Chapter 7 From Displacement to Strain (pages 191–222): Pierre Feissel
Chapter 8 Introduction to Identification Methods (pages 223–246): Marc Bonnet
Chapter 9 Parameter Identification from Mechanical Field Measurements using Finite Element Model Updating Strategies (pages 247–274): Emmanuel Pagnacco, Anne?Sophie Caro?Bretelle and Patrick Ienny
Chapter 10 Constitutive Equation Gap (pages 275–300): Stephane Pagano and Marc Bonnet
Chapter 11 Virtual Fields Method, The (pages 301–330): Michel Grediac, Fabrice Pierron, Stephane Avril, Evelyne Toussaint and Marco Rossi
Chapter 12 Equilibrium Gap Method (pages 331–362): Fabien Amiot, Jean?Noel Perie and Stephane Roux
Chapter 13 Reciprocity Gap Method (pages 363–378): Stephane Andrieux, Huy Duong Bui and Andrei Constantinescu
Chapter 14 Characterization of Localized Phenomena (pages 379–410): Jacques Desrues and Julien Rethore
Chapter 15 From Microstructure to Constitutive Laws (pages 411–438): Jerome Crepin and Stephane Roux
Chapter 16 Thermographic Analysis of Material Behavior (pages 439–468): Jean?Christophe Batsale, Andre Chrysochoos, Herve Pron and Bertrand Wattrisse

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