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Fundamentals Of Atomic Force Microscopy Part I Foundations Ronald Reifenberger

Name: Fundamentals Of Atomic Force Microscopy Part I Foundations Ronald Reifenberger
SKU: BELL-5701374
Price: 31.00 USD
Availability: InStock
Rating: 4.7 (96 reviews)

SKU: BELL-5701374

$ 31.00 ~~$ 45.00~~ (-31%)

4.7

96 reviews

Fundamentals Of Atomic Force Microscopy Part I Foundations Ronald Reifenberger instant download after payment.

Publisher: World Scientific Publishing Co

File Extension: PDF

File size: 13.27 MB

Pages: 340

Author: Ronald Reifenberger

ISBN: 9789814630344, 9814630349

Language: English

Year: 2016

Product desciption

Fundamentals Of Atomic Force Microscopy Part I Foundations Ronald Reifenberger by Ronald Reifenberger 9789814630344, 9814630349 instant download after payment.

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

Useful as a study guide to Fundamentals of AFM. This title is also suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Readership: Advanced undergraduates and graduates in physics, chemistry, materials science and engineering disciplines with an interest in Atomic Force Microscopy and its applications in nanotechnology.