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Fundamentals Of Modern Vlsi Devices 3rd Edition Yuan Taur Tak H Ning

  • SKU: BELL-46835516
Fundamentals Of Modern Vlsi Devices 3rd Edition Yuan Taur Tak H Ning
$ 31.00 $ 45.00 (-31%)

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Fundamentals Of Modern Vlsi Devices 3rd Edition Yuan Taur Tak H Ning instant download after payment.

Publisher: Cambridge University Press
File Extension: PDF
File size: 23.62 MB
Pages: 622
Author: Yuan Taur, Tak H. Ning
ISBN: 9781108480024, 1108480020
Language: English
Year: 2022
Edition: 3

Product desciption

Fundamentals Of Modern Vlsi Devices 3rd Edition Yuan Taur Tak H Ning by Yuan Taur, Tak H. Ning 9781108480024, 1108480020 instant download after payment.

A thoroughly updated third edition of an classic and widely adopted text, perfect for practical transistor design and in the classroom. Covering a variety of recent developments, the internationally renowned authors discuss in detail the basic properties and designs of modern VLSI devices, as well as factors affecting performance. Containing around 25% new material, coverage has been expanded to include high-k gate dielectrics, metal gate technology, strained silicon mobility, non-GCA (Gradual Channel Approximation) modelling of MOSFETs, short-channel FinFETS, and symmetric lateral bipolar transistors on SOI. Chapters have been reorganized to integrate the appendices into the main text to enable a smoother learning experience, and numerous additional end-of-chapter homework exercises (+30%) are included to engage students with real-world problems and test their understanding. A perfect text for senior undergraduate and graduate students taking advanced semiconductor devices courses, and for practicing silicon device professionals in the semiconductor industry.

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