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Handbook Of Microwave Component Measurements With Advanced Vna Techniques Joel P Dunsmore

  • SKU: BELL-4305604
Handbook Of Microwave Component Measurements With Advanced Vna Techniques Joel P Dunsmore
$ 31.00 $ 45.00 (-31%)

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Handbook Of Microwave Component Measurements With Advanced Vna Techniques Joel P Dunsmore instant download after payment.

Publisher: Wiley
File Extension: PDF
File size: 26.54 MB
Pages: 631
Author: Joel P. Dunsmore
ISBN: 9781118391242, 9781119979555, 1118391241, 1119979552
Language: English
Year: 2012

Product desciption

Handbook Of Microwave Component Measurements With Advanced Vna Techniques Joel P Dunsmore by Joel P. Dunsmore 9781118391242, 9781119979555, 1118391241, 1119979552 instant download after payment.

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers.

The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters.  The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory.

Key Features:

  • Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
  • Offers a detailed explanation of algorithms and mathematics behind measurements and error correction
  • Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world

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