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Hot Carrier Degradation In Semiconductor Devices 1st Edition Tibor Grasser Eds

Name: Hot Carrier Degradation In Semiconductor Devices 1st Edition Tibor Grasser Eds
SKU: BELL-4931950
Price: 31.00 USD
Availability: InStock
Rating: 4.4 (82 reviews)

SKU: BELL-4931950

$ 31.00 ~~$ 45.00~~ (-31%)

4.4

82 reviews

Hot Carrier Degradation In Semiconductor Devices 1st Edition Tibor Grasser Eds instant download after payment.

Publisher: Springer International Publishing

File Extension: PDF

File size: 21.47 MB

Pages: 517

Author: Tibor Grasser (eds.)

ISBN: 9783319089935, 9783319089942, 3319089935, 3319089943

Language: English

Year: 2015

Edition: 1

Product desciption

Hot Carrier Degradation In Semiconductor Devices 1st Edition Tibor Grasser Eds by Tibor Grasser (eds.) 9783319089935, 9783319089942, 3319089935, 3319089943 instant download after payment.

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.