Insitu Electron Microscopy Applications In Physics Chemistry And Materials Science Gerhard Dehm by Gerhard Dehm, James M. Howe, Josef Zweck 9783527319732, 9783527652167, 3527319735, 3527652167 instant download after payment.

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.Content:
Chapter 1 Introduction to Scanning Electron Microscopy (pages 1–37): Christina Scheu and Wayne D. Kaplan
Chapter 2 Conventional and Advanced Electron Transmission Microscopy (pages 39–69): Christoph Koch
Chapter 3 Dynamic Transmission Electron Microscopy (pages 71–97): Thomas Lagrange, Bryan W. Reed, Wayne E. King, Judy S. Kim and Geoffrey H. Campbell
Chapter 4 Formation of Surface Patterns Observed with Reflection Electron Microscopy (pages 99–122): Alexander V. Latyshev
Chapter 5 Electron and Ion Irradiation (pages 123–143): Florian Banhart
Chapter 6 Observing Chemical Reactions Using Transmission Electron Microscopy (pages 145–170): Renu Sharma
Chapter 7 In?Situ TEM Studies of Vapor? and Liquid?Phase Crystal Growth (pages 171–189): Frances M. Ross
Chapter 8 In?Situ TEM Studies of Oxidation (pages 191–208): Guangwen Zhou and Judith C. Yang
Chapter 9 Mechanical Testing with the Scanning Electron Microscope (pages 209–225): Christian Motz
Chapter 10 In?Situ TEM Straining Experiments: Recent Progress in Stages and Small?Scale Mechanics (pages 227–254): Gerhard Dehm, Marc Legros and Daniel Kiener
Chapter 11 In?Situ Nanoindentation in the Transmission Electron Microscope (pages 255–277): Andrew M. Minor
Chapter 12 Current?Induced Transport: Electromigration (pages 279–301): Ralph Spolenak
Chapter 13 Cathodoluminescence in Scanning and Transmission Electron Microscopies (pages 303–319): Yutaka Ohno and Seiji Takeda
Chapter 14 In?Situ TEM with Electrical Bias on Ferroelectric Oxides (pages 321–346): Xiaoli Tan
Chapter 15 Lorentz Microscopy (pages 347–369): Josef Zweck