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Leakage Current And Defect Characterization Of Short Channel Mosfets 1st Edition Guntrade Roll

  • SKU: BELL-51627042
Leakage Current And Defect Characterization Of Short Channel Mosfets 1st Edition Guntrade Roll
$ 31.00 $ 45.00 (-31%)

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Leakage Current And Defect Characterization Of Short Channel Mosfets 1st Edition Guntrade Roll instant download after payment.

Publisher: Logos Verlag Berlin
File Extension: PDF
File size: 14.7 MB
Pages: 242
Author: Guntrade Roll
ISBN: 9783832596668, 3832596666
Language: English
Year: 2012
Edition: 1

Product desciption

Leakage Current And Defect Characterization Of Short Channel Mosfets 1st Edition Guntrade Roll by Guntrade Roll 9783832596668, 3832596666 instant download after payment.

The continuous improvement in semiconductor technology requires field effect transistor scaling while maintaining acceptable leakage currents. This study analyzes the effect of scaling on the leakage current and defect distribution in peripheral DRAM transistors. The influence of important process changes, such as the high-k gate patterning and encapsulation as well as carbon co-implants in the source/drain junction are investigated by advanced electrical measurements and TCAD simulation. A complete model for the trap assisted leakage currents in the silicon bulk of the transistors is presented.

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