Lockin Thermography Basics And Use For Evaluating Electronic Devices And Materials 2nd Edition Otwin Breitenstein by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp (auth.) 9783642024160, 3642024165 instant download after payment.

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.