Mechanical Stress On The Nanoscale Simulation Material Systems And Characterization Techniques Margrit Hanbucken Pierre Muller Ralf B Wehrspohn by Margrit Hanbücken; Pierre Müller; Ralf B Wehrspohn 9781283379496, 9783527639540, 9783527639557, 9783527639564, 128337949X, 3527639543, 3527639551, 352763956X instant download after payment.

Content: Front Matter --
Fundamentals of Stress and Strain on the Nanoscale. Elastic Strain Relaxation: Thermodynamics and Kinetics / Frank Glas --
Fundamentals of Stress and Strain at the Nanoscale Level: Toward Nanoelasticity / Pierre Muller --
Onset of Plasticity in Crystalline Nanomaterials / Laurent Pizzagalli, Sandrine Brochard, Julien Godet --
Relaxations on the Nanoscale: An Atomistic View by Numerical Simulations / Christine Mottet --
Model Systems with Stress-Engineered Properties. Accommodation of Lattice Misfit in Semiconductor Heterostructure Nanowires / Volker Schmidt, Joerg V Wittemann --
Strained Silicon Nanodevices / Manfred Reiche, Oussama Moutanabbir, Jan Hoentschel, Angelika H̃hnel, Stefan Flachowsky, Ulrich G̲sele, Manfred Horstmann --
Stress-Driven Nanopatterning in Metallic Systems / Vincent Repain, Sylvie Rousset, Shobhana Narasimhan --
Semiconductor Templates for the Fabrication of Nano-Objects / Jo︠l Eymery, Laurence Masson, Houda Sahaf, Margrit Hanbucken --
Characterization Techniques of Measuring Stresses on the Nanoscale. Strain Analysis in Transmission Electron Microscopy: How Far can we go? / Anne Ponchet, Christophe Gatel, Christian Roucau, Marie-Još Casanove --
Determination of Elastic Strains Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Michael Krause, Matthias Petzold, Ralf B Wehrspohn --
X-Ray Diffraction Analysis of Elastic Strains at the Nanoscale / Olivier Thomas, Odile Robach, Sťphanie Escoubas, Jean-Šbastien Micha, Nicolas Vaxelaire, Olivier Perroud --
Diffuse X-Ray Scattering at Low-Dimensional Structures in the System SiGe/Si / Michael Hanke --
Direct Measurement of Elastic Displacement Modes by Grazing Incidence X-Ray Diffraction / Geoffroy Přvot --
Submicrometer-Scale Characterization of Solar Silicon by Raman Spectroscopy / Michael Becker, George Sarau, Silke Christiansen --
Strain-Induced Nonlinear Optics in Silicon / Clemens Schriever, Christian Bohley, Ralf B Wehrspohn --
Index.