Metal Impurities In Silicon And Germaniumbased Technologies Origin Characterization Control And Device Impact 1st Ed Cor Claeys by Cor Claeys, Eddy Simoen 9783319939247, 9783319939254, 3319939246, 3319939254 instant download after payment.

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.