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Microelectronic Failure Analysis Desk Reference 2001 Supplement Asm International

SKU: BELL-5434302

$ 31.00 ~~$ 45.00~~ (-31%)

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Microelectronic Failure Analysis Desk Reference 2001 Supplement Asm International instant download after payment.

Publisher: ASM International

File Extension: PDF

File size: 20.65 MB

Pages: 171

Author: ASM International

ISBN: 9780871707451, 0871707454

Language: English

Year: 2001

Product desciption

Microelectronic Failure Analysis Desk Reference 2001 Supplement Asm International by Asm International 9780871707451, 0871707454 instant download after payment.

CD-ROM content is in fully searchable Adobe Acrobat PDF format, Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee. Provides new or expanded coverage on important techniques for microelectronic failure analysis. Contents include: Backside isolation techniques; Flip-chip focused ion beam backside navigation; Circuit validation techniques; Copper metallization deprocessing; Tunnelling atomic force microscopy; Scanning capacitance microscopy; Scanning probe microscopy; Packaging and chip cross-sectioning; Glossary of failure analysis tool acronyms; Updated key word index to ISTFA Proceedings volumes and to the Microelectronic Failure Analysis Desk Reference, 4th Edition. (+VAT on UK orders)