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Nanoparticle Engineering For Chemicalmechanical Planarization Fabrication Of Nextgeneration Nanodevices 1st Edition Paik

  • SKU: BELL-34883380
Nanoparticle Engineering For Chemicalmechanical Planarization Fabrication Of Nextgeneration Nanodevices 1st Edition Paik
$ 31.00 $ 45.00 (-31%)

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Nanoparticle Engineering For Chemicalmechanical Planarization Fabrication Of Nextgeneration Nanodevices 1st Edition Paik instant download after payment.

Publisher: CRC Press
File Extension: PDF
File size: 19.99 MB
Pages: 222
Author: Paik, Ungyu, Park, Jea-Gun
ISBN: 9781420059113, 1420059114
Language: English
Year: 2019
Edition: 1

Product desciption

Nanoparticle Engineering For Chemicalmechanical Planarization Fabrication Of Nextgeneration Nanodevices 1st Edition Paik by Paik, Ungyu, Park, Jea-gun 9781420059113, 1420059114 instant download after payment.

In the development of next-generation nanoscale devices, higher speed and lower power operation is the name of the game. Increasing reliance on mobile computers, mobile phone, and other electronic devices demands a greater degree of speed and power. As chemical mechanical planarization (CMP) progressively becomes perceived less as black art and more as a cutting-edge technology, it is emerging as the technology for achieving higher performance devices. Nanoparticle Engineering for Chemical-Mechanical Planarization explains the physicochemical properties of nanoparticles according to each step in the CMP process, including dielectric CMP, shallow trend isolation CMP, metal CMP, poly isolation CMP, and noble metal CMP. The authors provide a detailed guide to nanoparticle engineering of novel CMP slurry for next-generation nanoscale devices below the 60nm design rule. They present design techniques using polymeric additives to improve CMP performance. The final chapter focuses on novel CMP slurry for the application to memory devices beyond 50nm technology. Most books published on CMP focus on the polishing process, equipment, and cleaning. Even though some of these books may touch on CMP slurries, the methods they cover are confined to conventional slurries and none cover them with the detail required for the development of next-generation devices. With its coverage of fundamental concepts and novel technologies, this book delivers expert insight into CMP for all current and next-generation systems.

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