Progress In Nanoscale Characterization And Manipulation 1st Ed Rongming Wang by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai 9789811304538, 9789811304545, 9782018943258, 2018943251, 981130453X, 9811304548 instant download after payment.

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.