logo

EbookBell.com

Most ebook files are in PDF format, so you can easily read them using various software such as Foxit Reader or directly on the Google Chrome browser.
Some ebook files are released by publishers in other formats such as .awz, .mobi, .epub, .fb2, etc. You may need to install specific software to read these formats on mobile/PC, such as Calibre.

Please read the tutorial at this link:  https://ebookbell.com/faq 


We offer FREE conversion to the popular formats you request; however, this may take some time. Therefore, right after payment, please email us, and we will try to provide the service as quickly as possible.


For some exceptional file formats or broken links (if any), please refrain from opening any disputes. Instead, email us first, and we will try to assist within a maximum of 6 hours.

EbookBell Team

Progress In Pattern Recognition Image Analysis Computer Vision And Applications 16th Iberoamerican Congress Ciarp 2011 Pucn Chile November 1518 2011 Proceedings 1st Edition Robert P W Duin

  • SKU: BELL-2456260
Progress In Pattern Recognition Image Analysis Computer Vision And Applications 16th Iberoamerican Congress Ciarp 2011 Pucn Chile November 1518 2011 Proceedings 1st Edition Robert P W Duin
$ 31.00 $ 45.00 (-31%)

0.0

0 reviews

Progress In Pattern Recognition Image Analysis Computer Vision And Applications 16th Iberoamerican Congress Ciarp 2011 Pucn Chile November 1518 2011 Proceedings 1st Edition Robert P W Duin instant download after payment.

Publisher: Springer-Verlag Berlin Heidelberg
File Extension: PDF
File size: 17.6 MB
Pages: 721
Author: Robert P. W. Duin, Elżbieta Pȩkalska (auth.), César San Martin, Sang-Woon Kim (eds.)
ISBN: 9783642250842, 364225084X
Language: English
Year: 2011
Edition: 1

Product desciption

Progress In Pattern Recognition Image Analysis Computer Vision And Applications 16th Iberoamerican Congress Ciarp 2011 Pucn Chile November 1518 2011 Proceedings 1st Edition Robert P W Duin by Robert P. W. Duin, Elżbieta Pȩkalska (auth.), César San Martin, Sang-woon Kim (eds.) 9783642250842, 364225084X instant download after payment.

This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.

Related Products