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Reliability And Radiation Effects In Compound Semiconductors Johnston

  • SKU: BELL-4322112
Reliability And Radiation Effects In Compound Semiconductors Johnston
$ 31.00 $ 45.00 (-31%)

4.8

64 reviews

Reliability And Radiation Effects In Compound Semiconductors Johnston instant download after payment.

Publisher: World Scientific
File Extension: PDF
File size: 3.92 MB
Pages: 375
Author: Johnston, Allan
ISBN: 9781615836871, 9789814277105, 161583687X, 981427710X
Language: English
Year: 2010

Product desciption

Reliability And Radiation Effects In Compound Semiconductors Johnston by Johnston, Allan 9781615836871, 9789814277105, 161583687X, 981427710X instant download after payment.

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. First, it starts with principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for 10 years or more with low failure rates.

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