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Reliability Of Multiphysical Systems Set Volume 2 Nanometerscale Defect Detection Using Polarized Light 1st Edition Dahoo

  • SKU: BELL-5700538
Reliability Of Multiphysical Systems Set Volume 2 Nanometerscale Defect Detection Using Polarized Light 1st Edition Dahoo
$ 31.00 $ 45.00 (-31%)

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Reliability Of Multiphysical Systems Set Volume 2 Nanometerscale Defect Detection Using Polarized Light 1st Edition Dahoo instant download after payment.

Publisher: Wiley-ISTE
File Extension: PDF
File size: 10.08 MB
Pages: 320
Author: Dahoo, Pierre Richard; El Hami, Abdelkhalak; Pougnet, Philippe
ISBN: 9781119329657, 9781848219366, 1119329655, 1848219369
Language: English
Year: 2016
Edition: 1

Product desciption

Reliability Of Multiphysical Systems Set Volume 2 Nanometerscale Defect Detection Using Polarized Light 1st Edition Dahoo by Dahoo, Pierre Richard; El Hami, Abdelkhalak; Pougnet, Philippe 9781119329657, 9781848219366, 1119329655, 1848219369 instant download after payment.

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

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