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Robust Speckle Metrology Techniques For Stress Analysis And Ndt Albertazzi

Name: Robust Speckle Metrology Techniques For Stress Analysis And Ndt Albertazzi
SKU: BELL-5279544
Price: 31.00 USD
Availability: InStock
Rating: 4 (76 reviews)

SKU: BELL-5279544

$ 31.00 ~~$ 45.00~~ (-31%)

4.0

76 reviews

Robust Speckle Metrology Techniques For Stress Analysis And Ndt Albertazzi instant download after payment.

Publisher: SPIE

File Extension: PDF

File size: 24.92 MB

Pages: 202

Author: Albertazzi, Armando; Viotti, Matias R

ISBN: 9781628413182, 9781628413199, 1628413182, 1628413190

Language: English

Year: 2014

Product desciption

Robust Speckle Metrology Techniques For Stress Analysis And Ndt Albertazzi by Albertazzi, Armando; Viotti, Matias R 9781628413182, 9781628413199, 1628413182, 1628413190 instant download after payment.

Optical techniques are usually applied inside laboratories equipped with temperature, humidity and vibration control. These techniques are very suitable for fast measurements due to their noncontact nature and their capability to measure on surfaces without special, time-consuming preparation. Among them, optical methods based on the speckle phenomenon have developed substantially over the last two decades due to the development of digital image processing, digital cameras, computers, lasers, and optical components. However, applying speckle methods outside of the laboratory becomes a challenging task. This book presents techniques and tools that will enable the development of robust measurement instruments to be used outside the laboratory for nondestructive structural-integrity-evaluation devices. Additionally, several technical solutions that combine mechanical systems to solve industrial measurement demands are described.
Abstract: Presents techniques and tools that will enable the development of robust measurement instruments to be used outside the laboratory for nondestructive structural-integrity-evaluation devices. Additionally, several technical solutions that combine mechanical systems to solve industrial measurement demands are described.