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Rough Sets And Knowledge Technology Second International Conference Rskt 2007 Toronto Canada May 1416 2007 Proceedings 1st Edition Yiyu Yao Auth

  • SKU: BELL-4240088
Rough Sets And Knowledge Technology Second International Conference Rskt 2007 Toronto Canada May 1416 2007 Proceedings 1st Edition Yiyu Yao Auth
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Rough Sets And Knowledge Technology Second International Conference Rskt 2007 Toronto Canada May 1416 2007 Proceedings 1st Edition Yiyu Yao Auth instant download after payment.

Publisher: Springer-Verlag Berlin Heidelberg
File Extension: PDF
File size: 17.93 MB
Pages: 578
Author: Yiyu Yao (auth.), JingTao Yao, Pawan Lingras, Wei-Zhi Wu, Marcin Szczuka, Nick J. Cercone, Dominik Ślȩzak (eds.)
ISBN: 9783540724575, 9783540724582, 3540724575, 3540724583
Language: English
Year: 2007
Edition: 1

Product desciption

Rough Sets And Knowledge Technology Second International Conference Rskt 2007 Toronto Canada May 1416 2007 Proceedings 1st Edition Yiyu Yao Auth by Yiyu Yao (auth.), Jingtao Yao, Pawan Lingras, Wei-zhi Wu, Marcin Szczuka, Nick J. Cercone, Dominik Ślȩzak (eds.) 9783540724575, 9783540724582, 3540724575, 3540724583 instant download after payment.

This book constitutes the refereed proceedings of the Second International Conference on Rough Sets and Knowledge Technology, RSKT 2007, held in Toronto, Canada in May 2007 in conjunction with the 11th International Conference on Rough Sets, Fuzzy Sets, Data Mining, and Granular Computing, RSFDGrC 2007, both as part of the Joint Rough Set Symposium, JRS 2007.

The 67 revised full papers presented together with three invited papers were carefully reviewed and selected from a total of 319 general submissions to the JRS 2007 symposium. The papers are organized in topical sections on rough set foundations, multiple criteria decision analysis, biometrics, kansei engineering, autonomy-oriented computing, soft computing in bioinformatics, ubiquitous computing and networking, rough set algorithms, knowledge representation and reasoning, genetic algorithms, and rough set applications.

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