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Secondary Ion Mass Spectrometry Applications For Depth Profiling And Surface Characterization Fred Stevie

Name: Secondary Ion Mass Spectrometry Applications For Depth Profiling And Surface Characterization Fred Stevie
SKU: BELL-5846746
Price: 31.00 USD
Availability: InStock
Rating: 4.25 (78 reviews)

SKU: BELL-5846746

$ 31.00 ~~$ 45.00~~ (-31%)

4.3

78 reviews

Secondary Ion Mass Spectrometry Applications For Depth Profiling And Surface Characterization Fred Stevie instant download after payment.

Publisher: Momentum Press

File Extension: PDF

File size: 43.78 MB

Pages: 290

Author: Fred Stevie

ISBN: 9781606505885, 9781606505892, 1606505882, 1606505890

Language: English

Year: 2016

Product desciption

Secondary Ion Mass Spectrometry Applications For Depth Profiling And Surface Characterization Fred Stevie by Fred Stevie 9781606505885, 9781606505892, 1606505882, 1606505890 instant download after payment.

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique