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Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications 1st edition M. Jamal Deen (eds.)

Name: Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications 1st edition M. Jamal Deen (eds.)
SKU: BELL-4549816
Price: 31.00 USD
Availability: InStock
Rating: 5 (18 reviews)

SKU: BELL-4549816

$ 31.00 ~~$ 45.00~~ (-31%)

5.0

18 reviews

Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications 1st edition M. Jamal Deen (eds.) instant download after payment.

Publisher: Academic Press

File Extension: PDF

File size: 14.19 MB

Pages: 1

Author: M. Jamal Deen (Eds.)

ISBN: 9780123942982, 0123942985

Language: English

Year: 2012

Edition: 1

Product desciption

Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications 1st edition M. Jamal Deen (eds.) by M. Jamal Deen (eds.) 9780123942982, 0123942985 instant download after payment.

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field