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Terrestrial Neutroninduced Soft Errors In Advanced Memory Devices Takashi Nakamura

  • SKU: BELL-1379590
Terrestrial Neutroninduced Soft Errors In Advanced Memory Devices Takashi Nakamura
$ 31.00 $ 45.00 (-31%)

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Terrestrial Neutroninduced Soft Errors In Advanced Memory Devices Takashi Nakamura instant download after payment.

Publisher: World Scientific Publishing Company
File Extension: PDF
File size: 13.97 MB
Pages: 364
Author: Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, Mamoru Baba
ISBN: 9789812778819, 9812778810
Language: English
Year: 2008

Product desciption

Terrestrial Neutroninduced Soft Errors In Advanced Memory Devices Takashi Nakamura by Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, Mamoru Baba 9789812778819, 9812778810 instant download after payment.

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.

This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Contents: Terrestrial Neutron Spectrometry and Dosimetry; Irradiation Testing in the Terrestrial Field; Neutron Irradiation Test Facilities; Review and Discussion of Experimental Data; Monte Carlo Simulation Methods; Simulation Results and Their Implications; International Standardization of the Neutron Test Method; Summary and Challenges.

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