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Test And Diagnosis Of Analogue Mixedsignal And Rf Integrated Circuits The System On Chip Approach Sun

  • SKU: BELL-4322048
Test And Diagnosis Of Analogue Mixedsignal And Rf Integrated Circuits The System On Chip Approach Sun
$ 31.00 $ 45.00 (-31%)

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Test And Diagnosis Of Analogue Mixedsignal And Rf Integrated Circuits The System On Chip Approach Sun instant download after payment.

Publisher: Institution of Engineering and Technology
File Extension: PDF
File size: 5.47 MB
Pages: 404
Author: Sun, Yichuang(eds.)
ISBN: 9780863417450, 9781615833153, 0863417450, 1615833153
Language: English
Year: 2008

Product desciption

Test And Diagnosis Of Analogue Mixedsignal And Rf Integrated Circuits The System On Chip Approach Sun by Sun, Yichuang(eds.) 9780863417450, 9781615833153, 0863417450, 1615833153 instant download after payment.

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state-of-the-arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective.

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