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Testing Of Interposerbased 25d Integrated Circuits Ran Wang And Krishnendu Chakrabarty

  • SKU: BELL-5864208
Testing Of Interposerbased 25d Integrated Circuits Ran Wang And Krishnendu Chakrabarty
$ 31.00 $ 45.00 (-31%)

4.1

10 reviews

Testing Of Interposerbased 25d Integrated Circuits Ran Wang And Krishnendu Chakrabarty instant download after payment.

Publisher: Springer
File Extension: PDF
File size: 12.52 MB
Pages: 192
Author: Ran Wang and Krishnendu Chakrabarty
ISBN: 9783319547138, 9783319547145, 3319547135, 3319547143
Language: English
Year: 2017

Product desciption

Testing Of Interposerbased 25d Integrated Circuits Ran Wang And Krishnendu Chakrabarty by Ran Wang And Krishnendu Chakrabarty 9783319547138, 9783319547145, 3319547135, 3319547143 instant download after payment.

This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.

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