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Thermal Reliability Of Power Semiconductor Device In The Renewable Energy System Xiong Du

Name: Thermal Reliability Of Power Semiconductor Device In The Renewable Energy System Xiong Du
SKU: BELL-43837474
Price: 31.00 USD
Availability: InStock
Rating: 4.7 (46 reviews)

SKU: BELL-43837474

$ 31.00 ~~$ 45.00~~ (-31%)

4.7

46 reviews

Thermal Reliability Of Power Semiconductor Device In The Renewable Energy System Xiong Du instant download after payment.

Publisher: Springer

File Extension: PDF

File size: 7.85 MB

Pages: 220

Author: Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du

ISBN: 9789811931314, 9811931313

Language: English

Year: 2022

Product desciption

Thermal Reliability Of Power Semiconductor Device In The Renewable Energy System Xiong Du by Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du 9789811931314, 9811931313 instant download after payment.

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.