Transmission Electron Energy Loss Spectrometry In Materials Science And The Eels Atlas Second Edition Channing C Ahn by Channing C. Ahn 9783527405657, 9783527605491, 3527405658, 3527605495 instant download after payment.

This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Content:
Chapter 1 Introduction (pages 1–19): Brent Fultz
Chapter 2 Experimental Techniques and Instrumentation (pages 21–47): Ray F. Egerton
Chapter 3 EELS Quantitative Analysis (pages 49–96): Richard Leapman
Chapter 4 Energy Loss Fine Structure (pages 97–126): Peter Rez
Chapter 5 Energy Filtered Diffraction (pages 127–158): Ludwig Reimer
Chapter 6 Elemental Mapping Using Energy Filtered Imaging (pages 159–222): Ferdinand Hofer and Peter Warbichler
Chapter 7 Probing Materials Chemistry Using ELNES (pages 223–270): Richard Morgan Drummond?Brydson, Hermann Sauer and Wilfried Engel
Chapter 8 Application of EELS to Ceramics, Catalysts and Transition Metal Oxides (pages 271–316): J. Bentley and J. Graetz
Chapter 9 EELS Analysis of the Electronic Structure and Microstructure of Metals (pages 317–352): J. K. Okamoto, D. H. Pearson, A. Hightower, C. C. Ahn and B. Fultz
Chapter 10 Electron Energy Loss Studies in Semiconductors (pages 353–384): Philip E. Batson
Chapter 11 Electron Energy Loss Spectroscopy of Magnetic Materials (pages 385–418): Jennifer A. Dooley
Chapter 12 Electron Energy Loss Spectroscopy of Polymers (pages 419–454): Matthew R. Libera and Mark M. Disko