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Vlsi Test Principles And Architectures Design For Testability 1st Edition Laungterng Wang

Name: Vlsi Test Principles And Architectures Design For Testability 1st Edition Laungterng Wang
SKU: BELL-1399256
Price: 31.00 USD
Availability: InStock
Rating: 5 (38 reviews)

SKU: BELL-1399256

$ 31.00 ~~$ 45.00~~ (-31%)

5.0

38 reviews

Vlsi Test Principles And Architectures Design For Testability 1st Edition Laungterng Wang instant download after payment.

Publisher: Morgan Kaufmann

File Extension: PDF

File size: 5.66 MB

Pages: 809

Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

ISBN: 9780123705976, 0123705975

Language: English

Year: 2006

Edition: 1

Product desciption

Vlsi Test Principles And Architectures Design For Testability 1st Edition Laungterng Wang by Laung-terng Wang, Cheng-wen Wu, Xiaoqing Wen 9780123705976, 0123705975 instant download after payment.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Г‚В· Most up-to-date coverage of design for testability. Г‚В· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Г‚В· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Г‚В· Lecture slides and exercise solutions for all chapters are now available. Г‚В· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.