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Vlsisoc Forwardlooking Trends In Ic And Systems Design 18th Ifip Wg 105ieee International Conference On Very Large Scale Integration Vlsisoc 2010 Madrid Spain September 2729 2010 Revised Selected Papers 1st Edition Aaron V T Do

  • SKU: BELL-4522428
Vlsisoc Forwardlooking Trends In Ic And Systems Design 18th Ifip Wg 105ieee International Conference On Very Large Scale Integration Vlsisoc 2010 Madrid Spain September 2729 2010 Revised Selected Papers 1st Edition Aaron V T Do
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Vlsisoc Forwardlooking Trends In Ic And Systems Design 18th Ifip Wg 105ieee International Conference On Very Large Scale Integration Vlsisoc 2010 Madrid Spain September 2729 2010 Revised Selected Papers 1st Edition Aaron V T Do instant download after payment.

Publisher: Springer-Verlag Berlin Heidelberg
File Extension: PDF
File size: 12.83 MB
Pages: 358
Author: Aaron V. T. Do, Chirn Chye Boon (auth.), José L. Ayala, David Atienza Alonso, Ricardo Reis (eds.)
ISBN: 9783642285653, 9783642285660, 3642285651, 364228566X
Language: English
Year: 2012
Edition: 1

Product desciption

Vlsisoc Forwardlooking Trends In Ic And Systems Design 18th Ifip Wg 105ieee International Conference On Very Large Scale Integration Vlsisoc 2010 Madrid Spain September 2729 2010 Revised Selected Papers 1st Edition Aaron V T Do by Aaron V. T. Do, Chirn Chye Boon (auth.), José L. Ayala, David Atienza Alonso, Ricardo Reis (eds.) 9783642285653, 9783642285660, 3642285651, 364228566X instant download after payment.

This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

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