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Xray Scattering From Semiconductors 2nd Ed Paul F Fewster

Name: Xray Scattering From Semiconductors 2nd Ed Paul F Fewster
SKU: BELL-989812
Price: 31.00 USD
Availability: InStock
Rating: 4.8 (14 reviews)

SKU: BELL-989812

$ 31.00 ~~$ 45.00~~ (-31%)

4.8

14 reviews

Xray Scattering From Semiconductors 2nd Ed Paul F Fewster instant download after payment.

Publisher: Imperial College Press

File Extension: PDF

File size: 7.26 MB

Pages: 314

Author: Paul F. Fewster

ISBN: 9781860943607, 1860943608

Language: English

Year: 2003

Edition: 2nd ed

Product desciption

Xray Scattering From Semiconductors 2nd Ed Paul F Fewster by Paul F. Fewster 9781860943607, 1860943608 instant download after payment.

Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the basic structural characteristics of materials, the theory of X-ray scattering, the principles of the instrumentation, and a number of examples of analyses. The analysis section covers bulk semiconductor materials, nearly perfect semiconductor multi-layer structures, mosaic structures, partially relaxed multi-layer structures, laterally inhomogeneous multi-layers, textured polycrystalline semiconductors, and nearly perfect polycrystalline materials.