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Ferroelectric Domain Walls Statics Dynamics And Functionalities Revealed By Atomic Force Microscopy 1st Edition Jill Guyonnet Auth

  • SKU: BELL-4662864
Ferroelectric Domain Walls Statics Dynamics And Functionalities Revealed By Atomic Force Microscopy 1st Edition Jill Guyonnet Auth
$ 31.00 $ 45.00 (-31%)

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Ferroelectric Domain Walls Statics Dynamics And Functionalities Revealed By Atomic Force Microscopy 1st Edition Jill Guyonnet Auth instant download after payment.

Publisher: Springer International Publishing
File Extension: PDF
File size: 9.12 MB
Pages: 159
Author: Jill Guyonnet (auth.)
ISBN: 9783319057491, 9783319057507, 3319057499, 3319057502
Language: English
Year: 2014
Edition: 1

Product desciption

Ferroelectric Domain Walls Statics Dynamics And Functionalities Revealed By Atomic Force Microscopy 1st Edition Jill Guyonnet Auth by Jill Guyonnet (auth.) 9783319057491, 9783319057507, 3319057499, 3319057502 instant download after payment.

Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization. Due to the local symmetry-breaking caused by the change in polarization, domain walls are found to possess an unexpected lateral piezoelectric response, even when this is symmetry-forbidden in the parent material. This has interesting potential applications in electromechanical devices based on ferroelectric domain patterning. Moreover, electrical conduction is shown to arise at domain walls in otherwise insulating lead zirconate titanate, the first such observation outside of multiferroic bismuth ferrite, due to the tendency of the walls to localize defects. The role of defects is then explored in the theoretical framework of disordered elastic interfaces possessing a characteristic roughness scaling and complex dynamic response. It is shown that the heterogeneous disorder landscape in ferroelectric thin films leads to a breakdown of the usual self-affine roughness, possibly related to strong pinning at individual defects. Finally, the roles of varying environmental conditions and defect densities in domain switching are explored and shown to be adequately modelled as a competition between screening effects and pinning.

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