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Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications 1st Edition by Masanori Okuyama, Yoshihiro Ishibashi ISBN 9783642063305

  • SKU: BELL-2158168
Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications 1st Edition by Masanori Okuyama, Yoshihiro Ishibashi ISBN 9783642063305
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Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications 1st Edition by Masanori Okuyama, Yoshihiro Ishibashi ISBN 9783642063305 instant download after payment.

Publisher: Springer-Verlag Berlin Heidelberg
File Extension: PDF
File size: 10.05 MB
Pages: 244
Author: Yoshihiro Ishibashi (auth.), Masanori Professor Okuyama, Yoshihiro Ishibashi (eds.)
ISBN: 3540241639
Language: English
Year: 2005
Edition: 1

Product desciption

Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications 1st Edition by Masanori Okuyama, Yoshihiro Ishibashi ISBN 9783642063305 by Yoshihiro Ishibashi (auth.), Masanori Professor Okuyama, Yoshihiro Ishibashi (eds.) 3540241639 instant download after payment.

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Product details:

ISBN 13: 9783642063305
Author: Masanori Okuyama, Yoshihiro Ishibashi

Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications 1st Table of contents:

  1. Theoretical Aspects of Phase Transitions in Ferroelectric Thin Films

  2. Chemical Solution Deposition of Layered-Structured Ferroelectric Thin Films

  3. PB-Based Ferroelectric Thin Films Prepared by MOCVD

  4. Spontaneous Polarization and Crystal Orientation Control of MOCVD PZT and Bi₄Ti₃O₁₂-Based Films

  5. Rhombohedral PZT Thin Films Prepared by Sputtering

  6. Scanning Nonlinear Dielectric Microscope

  7. Analysis of Ferroelectricity and Enhanced Piezoelectricity near Morphotropic Phase Boundary

  8. Correlation between Domain Structures in Dielectric Properties in Single Crystals of Ferroelectric Solid Solutions

  9. Relaxor Behaviors in Perovskite-Type Dielectric Compounds

  10. Artificial Control of Ordered/Disordered State of B-Site Ions in Ba(Zr,Ti)O₃ by a Superlattice Technique

  11. Physics of Ferroelectric Interface: An Attempt to Nano-Ferroelectric Physics

  12. Preparation and Property of Ferroelectric-Insulator-Semiconductor Junction Using YMNO₃ Thin Film

  13. Improvement of Memory Retention in Metal-Ferroelectric-Insulator-Semiconductor (MFIS) Structure

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Tags: Masanori Okuyama, Yoshihiro Ishibashi, Ferroelectric, Films

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