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Noncontact Atomic Force Microscopy 1st Edition Seizo Morita Auth

  • SKU: BELL-4204282
Noncontact Atomic Force Microscopy 1st Edition Seizo Morita Auth
$ 31.00 $ 45.00 (-31%)

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Noncontact Atomic Force Microscopy 1st Edition Seizo Morita Auth instant download after payment.

Publisher: Springer-Verlag Berlin Heidelberg
File Extension: PDF
File size: 33.05 MB
Pages: 440
Author: Seizo Morita (auth.), Prof. S. Morita, Prof. R. Wiesendanger, Prof. E. Meyer (eds.)
ISBN: 9783642560194, 9783642627729, 3642560199, 3642627722
Language: English
Year: 2002
Edition: 1

Product desciption

Noncontact Atomic Force Microscopy 1st Edition Seizo Morita Auth by Seizo Morita (auth.), Prof. S. Morita, Prof. R. Wiesendanger, Prof. E. Meyer (eds.) 9783642560194, 9783642627729, 3642560199, 3642627722 instant download after payment.

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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