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Noncontact Atomic Force Microscopy Volume 2 1st Edition Seizo Morita Auth

  • SKU: BELL-4193250
Noncontact Atomic Force Microscopy Volume 2 1st Edition Seizo Morita Auth
$ 31.00 $ 45.00 (-31%)

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Noncontact Atomic Force Microscopy Volume 2 1st Edition Seizo Morita Auth instant download after payment.

Publisher: Springer-Verlag Berlin Heidelberg
File Extension: PDF
File size: 15.39 MB
Pages: 401
Author: Seizo Morita (auth.), Seizo Morita, Franz J. Giessibl, Roland Wiesendanger (eds.)
ISBN: 9783642014949, 9783642014956, 3642014941, 364201495X
Language: English
Year: 2009
Edition: 1

Product desciption

Noncontact Atomic Force Microscopy Volume 2 1st Edition Seizo Morita Auth by Seizo Morita (auth.), Seizo Morita, Franz J. Giessibl, Roland Wiesendanger (eds.) 9783642014949, 9783642014956, 3642014941, 364201495X instant download after payment.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

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