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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Daniel M Fleetwood

Name: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Daniel M Fleetwood
SKU: BELL-1188392
Price: 31.00 USD
Availability: InStock
Rating: 4.8 (104 reviews)

SKU: BELL-1188392

$ 31.00 ~~$ 45.00~~ (-31%)

4.8

104 reviews

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Daniel M Fleetwood instant download after payment.

Publisher: World Scientific Pub

File Extension: PDF

File size: 16.73 MB

Pages: 297

Author: Daniel M. Fleetwood, R. D. Schrimpf

ISBN: 9789812389404, 9812389407

Language: English

Year: 2004

Product desciption

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Daniel M Fleetwood by Daniel M. Fleetwood, R. D. Schrimpf 9789812389404, 9812389407 instant download after payment.

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.