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Rapid Cryogenic Characterization Of 1024 Integrated Silicon Quantum Dot Devices Edward J Thomas Virginia N Cirianotejel David F Wise Domenic Prete Mathieu De Kruijf David J Ibberson Grayson M Noah Alberto Gomezsaiz M Fernando Gonzalezzalba Mark A I Johnson John J L Morton

  • SKU: BELL-239923380
Rapid Cryogenic Characterization Of 1024 Integrated Silicon Quantum Dot Devices Edward J Thomas Virginia N Cirianotejel David F Wise Domenic Prete Mathieu De Kruijf David J Ibberson Grayson M Noah Alberto Gomezsaiz M Fernando Gonzalezzalba Mark A I Johnson John J L Morton
$ 35.00 $ 45.00 (-22%)

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Rapid Cryogenic Characterization Of 1024 Integrated Silicon Quantum Dot Devices Edward J Thomas Virginia N Cirianotejel David F Wise Domenic Prete Mathieu De Kruijf David J Ibberson Grayson M Noah Alberto Gomezsaiz M Fernando Gonzalezzalba Mark A I Johnson John J L Morton instant download after payment.

Publisher: x
File Extension: PDF
File size: 6.93 MB
Author: Edward J. Thomas & Virginia N. Ciriano-Tejel & David F. Wise & Domenic Prete & Mathieu de Kruijf & David J. Ibberson & Grayson M. Noah & Alberto Gomez-Saiz & M. Fernando Gonzalez-Zalba & Mark A. I. Johnson & John J. L. Morton
Language: English
Year: 2025

Product desciption

Rapid Cryogenic Characterization Of 1024 Integrated Silicon Quantum Dot Devices Edward J Thomas Virginia N Cirianotejel David F Wise Domenic Prete Mathieu De Kruijf David J Ibberson Grayson M Noah Alberto Gomezsaiz M Fernando Gonzalezzalba Mark A I Johnson John J L Morton by Edward J. Thomas & Virginia N. Ciriano-tejel & David F. Wise & Domenic Prete & Mathieu De Kruijf & David J. Ibberson & Grayson M. Noah & Alberto Gomez-saiz & M. Fernando Gonzalez-zalba & Mark A. I. Johnson & John J. L. Morton instant download after payment.

Nature Electronics, doi:10.1038/s41928-024-01304-y