Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport

Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy

Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics

Principles of Kelvin Probe Force Microscopy

Frequency-Dependent Transport Imaging by Scanning Probe Microscopy

Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy

Principles of Near-Field Microwave Microscopy

Electromagnetic Singularities and Resonances in Near-Field Optical Probes

Electrochemical SPM

Near-Field High-Frequency Probing

Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors

Spin-Polarized Scanning Tunneling Microscopy

Scanning Probe Measurements of Electron Transport in Molecules

Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices

Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks

Theory of Scanning Probe Microscopy

Multi-Probe Scanning Tunneling Microscopy

Dynamic Force Microscopy and Spectroscopy in Vacuum

Scanning Tunneling Microscopy and Spectroscopy of Manganites

Scanning Voltage Microscopy

Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces

Electromechanical Behavior in Biological Systems at the Nanoscale

Scanning Capacitance Microscopy

Kelvin Probe Force Microscopy of Semiconductors

Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy

Electron Flow Through Molecular Structures

Electrical Characterization of Perovskite Nanostructures by SPM

SPM Measurements of Electric Properties of Organic Molecules

High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices

Electrical SPM-Based Nanofabrication Techniques

Fundamental Science and Lithographic Applications of Scanning Probe Oxidation

UHV-STM Nanofabrication on Silicon

Ferroelectric Lithography

Patterned Self-Assembled Monolayers via Scanning Probe Lithography

Resistive Probe Storage: Read/Write Mechanism