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Scanning Probe Microscopy In Nanoscience And Nanotechnology Vol 2 Bharat Bhushan Ed

  • SKU: BELL-4157556
Scanning Probe Microscopy In Nanoscience And Nanotechnology Vol 2 Bharat Bhushan Ed
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Scanning Probe Microscopy In Nanoscience And Nanotechnology Vol 2 Bharat Bhushan Ed instant download after payment.

Publisher: Springer
File Extension: PDF
File size: 20.89 MB
Pages: 844
Author: Bharat Bhushan (ed.)
ISBN: 9783642104978, 3642104975
Language: English
Year: 2010

Product desciption

Scanning Probe Microscopy In Nanoscience And Nanotechnology Vol 2 Bharat Bhushan Ed by Bharat Bhushan (ed.) 9783642104978, 3642104975 instant download after payment.

Part I Scanning Probe Microscopy Techniques -- Time-Resolved Tapping-Mode Atomic Force Microscopy / Ali Fatih Sarioglu and Olav Solgaard -- Small Amplitude Atomic Force Spectroscopy / Sissi de Beer, Dirk van den Ende, Daniel Ebeling, and Frieder Mugele -- Combining Scanning ProbeMicroscopy and Transmission Electron Microscopy / Alexandra Nafari, Johan Angenete, Krister Svensson, Anke Sanz-Velasco, and Håkan Olin -- Scanning Probe Microscopy and Grazing-Incidence Small-Angle Scattering as Complementary Tools for the Investigation of Polymer Films and Surfaces / Peter Müller-Buschbaum and Volker Körstgens -- Near-Field MicrowaveMicroscopy for Nanoscience and Nanotechnology / Kiejin Lee, Harutyun Melikyan, Arsen Babajanyan, and Barry Friedman -- Single Cluster AFM Manipulation: a Specialized Tool to Explore and Control Nanotribology Effects / Guido Paolicelli, Massimo Rovatti, and Sergio Valeri -- Part 2: Characterization -- Cell Adhesion Receptors Studied by AFM-Based Single-Molecule Force Spectroscopy / Robert H. Eibl -- Biological Application of Fast-Scanning Atomic Force Microscopy / Yuki Suzuki, Masatoshi Yokokawa, Shige H. Yoshimura, and Kunio Takeyasu -- Transport Properties of Graphene with Nanoscale Lateral Resolution / Filippo Giannazzo, Vito Raineri, and Emanuele Rimini -- Magnetic Force Microscopy Studies of Magnetic Features and Nanostructures / Lanping Yue and Sy-Hwang Liou -- Semiconductors Studied by Cross-sectional Scanning Tunneling Microscopy / J.K. Garleff, J.M. Ulloa, and P.M. Koenraad -- A Novel Approach for Oxide Scale Growth Characterization: Combining Etching with Atomic Force Microscopy / V. Presser, A. Loges, and K.G. Nickel -- The Scanning Probe-Based Deep Oxidation Lithography and Its Application in Studying the Spreading of Liquid n-Alkane / Yuguang Cai and Lingbo Lu -- Self-assembled Transition Metal Nanoparticles on Oxide Nanotemplates / Emanuele Cavaliere, Stefano Agnoli, Gaetano Granozzi, and Luca Gavioli -- Mechanical and Electrical Properties of Alkanethiol Self-Assembled Monolayers: A Conducting-Probe Atomic Force Microscopy Study / Frank W. DelRio and Robert F. Cook -- Assessment of Nanoadhesion and Nanofriction Properties of Formulated Cellulose-Based Biopolymers by AFM / Maurice Brogly, Ahmad Fahs, and Sophie Bistac -- Surface Growth Processes Induced by AFM Debris Production. A New Observable for Nanowear / Mario D'Acunto -- Frictional Stick-Slip Dynamics in a Deformable Potential / Djuidjé Kenmoé Germaine and Kofané Timoléon Crépin -- Capillary Adhesion and Nanoscale Properties of Water / Michael Nosonovsky and Bharat Bhushan -- On the Sensitivity of the Capillary Adhesion Force to the Surface Roughness / Michael Nosonovsky, Seung-Ho Yang, and Huan Zhang -- Part 3: Industrial Applications -- Nanoimaging, Molecular Interaction, and Nanotemplating of Human Rhinovirus / Markus Kastner, Christian Rankl, Andreas Ebner, Philipp D. Pollheimer, Stefan Howorka, Hermann J. Gruber, Dieter Blaas, and Peter Hinterdorfer -- Biomimetic Tailoring of the Surface Properties of Polymers at the Nanoscale: Medical Applications / Valeria Chiono, Emiliano Descrovi, Susanna Sartori, Piergiorgio Gentile, Mirko Ballarini, Fabrizio Giorgis, and Gianluca Ciardelli -- Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics / Christian Teichert and Igor Beinik -- Microscopic Electrical Characterization of Inorganic Semiconductor-Based Solar Cell Materials and Devices Using AFM-Based Techniques / Chun-Sheng Jiang -- Micro and Nanodevices for Thermoelectric Converters / J.P. Carmo, L.M. Gonçalves, and J.H. Correia

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