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Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging Analysis Nobuo Tanaka

  • SKU: BELL-4762714
Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging Analysis Nobuo Tanaka
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Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging Analysis Nobuo Tanaka instant download after payment.

Publisher: Imperial College Press
File Extension: PDF
File size: 34.73 MB
Pages: 400
Author: Nobuo Tanaka
ISBN: 9781848167896, 184816789X
Language: English
Year: 2014

Product desciption

Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging Analysis Nobuo Tanaka by Nobuo Tanaka 9781848167896, 184816789X instant download after payment.

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.

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