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Semiconductor Power Devices Physics Characteristics Reliability 1st Edition by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker 9783642111242 3642111246

  • SKU: BELL-21977294
Semiconductor Power Devices Physics Characteristics Reliability 1st Edition by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker 9783642111242 3642111246
$ 31.00 $ 45.00 (-31%)

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Semiconductor Power Devices Physics Characteristics Reliability 1st Edition by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker 9783642111242 3642111246 instant download after payment.

Publisher: Springer
File Extension: PDF
File size: 19.7 MB
Pages: 536
Author: Lutz, Josef;Schlangenotto, Heinrich;Scheuermann, Uwe;Doncker, Rik De
ISBN: 9783642111242, 9783642111259, 3642111246, 3642111254
Language: English
Year: 2011

Product desciption

Semiconductor Power Devices Physics Characteristics Reliability 1st Edition by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker 9783642111242 3642111246 by Lutz, Josef;schlangenotto, Heinrich;scheuermann, Uwe;doncker, Rik De 9783642111242, 9783642111259, 3642111246, 3642111254 instant download after payment.

Semiconductor Power Devices Physics Characteristics Reliability 1st Edition by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker - Ebook PDF Instant Download/Delivery: 9783642111242, 3642111246

Full download Semiconductor Power Devices Physics Characteristics Reliability 1st Edition after payment

 

Product details:

ISBN 10: 3642111246

ISBN 13: 9783642111242 

Author: Josef Lutz; Heinrich Schlangenotto; Uwe Scheuermann; Rik De Doncker

Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.

Table of contents:

1. Power Semiconductor Devices – Key Components for Efficient Electrical Energy Conversion Systems

2. Semiconductor Properties

3. pn-Junctions

4. Short Introduction to Power Device Technology

5. pin-Diodes

6. Schottky Diodes

7. Bipolar Transistors

8. Thyristors

9. MOS Transistors

10. IGBTs

11. Packaging and Reliability of Power Devices

12. Destructive Mechanisms in Power Devices

13. Power Device-Induced Oscillations and Electromagnetic Disturbances

14. Power Electronic Systems

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Tags: Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Semiconductor

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