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Semiconductor Power Devices Physics Characteristics Reliability 2nd Edition Josef Lutz

  • SKU: BELL-6989246
Semiconductor Power Devices Physics Characteristics Reliability 2nd Edition Josef Lutz
$ 31.00 $ 45.00 (-31%)

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Semiconductor Power Devices Physics Characteristics Reliability 2nd Edition Josef Lutz instant download after payment.

Publisher: Springer International Publishing
File Extension: PDF
File size: 22.74 MB
Author: Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker (auth.)
ISBN: 9783319709161, 9783319709178, 331970916X, 3319709178
Language: English
Year: 2018
Edition: 2

Product desciption

Semiconductor Power Devices Physics Characteristics Reliability 2nd Edition Josef Lutz by Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker (auth.) 9783319709161, 9783319709178, 331970916X, 3319709178 instant download after payment.

This book discusses semiconductor properties, pn-junctions and the physical phenomena for understanding power devices in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. Special peculiarities of devices from the ascending semiconductor materials SiC and GaN are discussed.

This book presents significant improvements compared to its first edition. It includes chapters on packaging and reliability. The chapter on semiconductor technology is written in a more in-depth way by considering 2D- and high concentration effects. The chapter on IGBTs is extended by new technologies and evaluation of its potential. An extended theory of cosmic ray failures is presented. The range of certain important physical relationships, doubted in recent papers for use in device simulation, is cleared and substantiated in this second edition.

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