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Spectroscopic Ellipsometry For Photovoltaics Volume 1 Fundamental Principles And Solar Cell Characterization 1st Ed Hiroyuki Fujiwara

  • SKU: BELL-9960292
Spectroscopic Ellipsometry For Photovoltaics Volume 1 Fundamental Principles And Solar Cell Characterization 1st Ed Hiroyuki Fujiwara
$ 31.00 $ 45.00 (-31%)

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Spectroscopic Ellipsometry For Photovoltaics Volume 1 Fundamental Principles And Solar Cell Characterization 1st Ed Hiroyuki Fujiwara instant download after payment.

Publisher: Springer International Publishing
File Extension: PDF
File size: 23.91 MB
Author: Hiroyuki Fujiwara, Robert W. Collins
ISBN: 9783319753751, 9783319753775, 3319753754, 3319753770
Language: English
Year: 2018
Edition: 1st ed.

Product desciption

Spectroscopic Ellipsometry For Photovoltaics Volume 1 Fundamental Principles And Solar Cell Characterization 1st Ed Hiroyuki Fujiwara by Hiroyuki Fujiwara, Robert W. Collins 9783319753751, 9783319753775, 3319753754, 3319753770 instant download after payment.

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.


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